Infrared detection using superlattices

Objective

•Use x-ray diffraction (XRD) to quantitatively characterize InAs/GaSb superlattices.

•Use cross sectional STM to determine exact atomic structure of InAs/GaSb interfaces.

•Fabricate moth eye antireflective surface for IR detectors.

Fig. 1 InAs/GaSb superlattice for IR-FPA.	Fig. 2 AFM of Moth-Eye coating.

Results

•XRD simulation can now be use to determine superlattice periodicity and strain.

•New electronics installed for x-STM and trained post-doc at ARFL.

•Moth-Eye surface with 0.25 micron features fabricated over 1 cm2.